Microscopy and Surface Science:
NanoWizard® II BioAFM (JPK Instruments AG)
Our NanoWizard® II BioAFM is equipped with the following accessories:
- BioCell™ coverslip based liquid cell
- Heating Cooling Stage – HCS™
- Kelvin Probe Module
The principle of AFM imaging can be resumed as follows: a sharp silicon probe is moved on a surface by means of a controlled piezo-based system. The probe interacts with the sample surface, and the probe deflections are recorded through the deflections of a laser beam, which reflects from the probe top side and is collected on photo-detector.
The signals from the detector and the feed-back piezo-based system are used for the image reconstitution by electronic means. The topography of the sample is recorded with the nanometric resolution. Other sample characteristics, origin from the probe-surface interactions, are acquired simultaneously with the topography in the different imaging modes and demonstrated as images.
BioCell is a coverslip liquid cell, making possible to convey the AFM & optical microscopy experiments in a controlled liquid environment (flow, temperature), which can be critical for living cell experiments.
Heating/Cooling device HCS is designed for experiments in a dry or liquid environment with a temperature range from 0°c to 100 °c. The sample heater is equipped with a magnetic sample holder.
Kelvin probe module enables to study electrical charges on a conductive or non-conductive surface. The Kelvin probe microscopy technique can be used to image samples presenting a distribution of electrical properties on inhomogeneous materials; to probe phase separation, chemical recognition and molecular orientation.
X-ray diffraction (XRD):
X-ray diffraction (XRD) is a non-destructive experimental technique aimed for all kinds of matter—ranging from fluids, to powders and crystals. This type of technique provide advanced, versatile, and cost-effective diffraction solutions for wide range of users from research, development, and quality control.
XRD is a scientific tool used in order to identify the atomic and molecular arrangement of crystalline molecules within the crystal structure. This molecular arrangement is determined by measuring the diffraction pattern obtained after the interaction of x-ray beam with a crystal structure. By measuring the diffraction angles and intensities, one can determine the mean positions of the atoms in the crystal.
The Russell Berrie Nanoparticles and Nanometric Systems Characterization Center is equipped with Rigaku SmartLab 3kW diffractometer instrument. The Rikagu SmartLab high-resolution diffraction system represents the state of the art x-ray diffraction instrument with fully automated modular systems. The system incorporates a high-resolution theta/theta closed loop goniometer drive system, cross beam optics (CBO), a 3.0 kW sealed tube anode generator, and D/tex Ultra 250 1D silicon strip detector. The instrument optical systems are fully automated thus providing advance measuring ability for both expert and novice users.
Our instrument is equipped with an Anton Paar TTK 450 mid-low temperature chamber providing sample cooling and heating in the range of -193°C to 450°C using liquid nitrogen. Such apparatus offers large temperature range and ease of use for a wide range of applications for liquid to solid materials. Vacuum (10⁻² mbar) conditions could also be used in this setup.